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ProductsContamination ControlPhysical

Mettler Toledo Launches AI-Enabled X-Ray Inspection System for Packaged Foods

By Food Safety Magazine Editorial Team
X56 DXD+ X-ray system
Image courtesy of Mettler Toledo
July 17, 2026

Mettler Toledo Product Inspection Group has introduced the X56 DXD+, a dual-energy photon-counting X-ray inspection system with artificial intelligence (AI) capabilities, expanding its X6 Series portfolio.

Designed for packaged food applications, the X56 DXD+ is intended to improve the detection of low-density physical contaminants, including rubber and plastic, that may be difficult to identify with conventional single-energy X-ray systems. According to Mettler Toledo, the system is suited for products with variable thickness, density, or overlapping textures, such as pet food, potato chips, and multi-pack products.

AI Capabilities Support Inspection Performance

Mettler Toledo said AI functionality integrated into the X56 DXD+ is intended to improve inspection accuracy while reducing unnecessary product rejects. The technology can help address inspection challenges involving overlapping or mixed products and improve production efficiency.

The AI inspection capability is also available on other X-ray systems within the company's product portfolio.

Dual Energy Technology for Complex Inspection Applications

The X56 DXD+ incorporates Mettler Toledo’s DXD+ detector technology and Advanced Material Discrimination Pro (AMD Pro) software. According to the company, the system is designed to improve contamination detection in packaged products with significant variation in thickness or density, where conventional single-energy X-ray systems may have reduced sensitivity.

The X56 DXD+ expands the company's X6 Series, which also includes the X16 system for high-speed inspection of individual packages and the X36.2 system for higher-throughput and customizable inspection applications, including multi-lane configurations. The new system is designed for medium- to large-sized products on single-lane lines or smaller packages inspected across multiple lanes within a 500 mm-wide system.

Designed for High-Speed Production Environments

According to Mettler Toledo, the X56 DXD+ also features an operator interface designed for ease of use, a toolless conveyor belt removal system for cleaning, and a hygienic design intended for high-volume production environments.

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The company said the system can inspect up to 500 products per minute.

In addition to contamination detection, the X56 DXD+ includes inspection functions such as completeness checks, clip detection, and product-in-seal inspection.

Connectivity and Compliance Features

The X56 DXD+ is available in single- and multi-lane configurations and supports multiple conveyor heights and reject options. Mettler Toledo said the system records inspection images for traceability and can be integrated with the company's ProdX data management software for centralized monitoring and documentation.

According to the company, integration with ProdX and support for common industrial network protocols enables automated monitoring, electronic recordkeeping, and audit documentation intended to support regulatory compliance.


Mettler Toledo: www.mt.com

KEYWORDS: detection systems inspection/detection Mettler-Toledo x-ray

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The Food Safety Magazine editorial team comprises Bailee Henderson, Director of Content Strategy and news editor ✉, and Adrienne Blume, M.A., Director of Editorial and Industry Engagement.

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